Topographical analysis for Voronoi-based modelling
28th Annual Conference of the IEEE Industrial Electronics SocietyIECON 2002
Seville/Spain
2002-11-05


CONGRESS BOOK
Proceedings of the 2002 28th Annual Conf. of the IEEE UIndustrial Electronics Society
ISBN0-7803-7474-6
EditorialIEEE
First page2548
Last page2553
Year2002