L. Moreno. Topographical analysis for Voronoi-based modelling. 28th Annual Conference of the IEEE Industrial Electronics SocietyIECON 2002. Proceedings of the 2002 28th Annual Conf. of the IEEE UIndustrial Electronics Society, ISBN: 0-7803-7474-6, pages: 2548 - 2553, IEEE. 2002-11-05, Seville, Spain. 2002.